Linear Structured Illumination Microscopy Applied in Super-Resolution Imaging
Ning Chu, EPFL STI LIB

Seminar • 01 September 2014 • BM 4 233

Abstract
Fluorescence microscopy is a powerful tool for investigating structural organization and dynamical processes on the cellular level. But its spatial resolution is very limited by the diffraction of light. Since the year of 2000, the linear Structured Illumination Microscopy (SIM) has become a breakthrough method, and it can achieve nearly 2 times of spatial resolution of fluorescence microscopy. However, the SIM is sensitive to optical pattern aberrations and noise interference, which are unavoidable in biological experiments. In this presentation, we firstly introduce the linear SIM models applied in 2D and 3D super-resolution imaging. Our contributions mainly focus on analyzing the Point Spread Function (PSF) in lateral and axial directions, as well as in multichannel light frequencies. To improve the SIM models, some techniques of inverse problems such as deconvlution and regularization are thus used in favor of the SIM robustness. Finally, we discuss the planning of the improved SIM in treating the newly-obtained real data offered by BIOP lab.