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Analytic Sensing: A New Approach to Source Imaging and Its Application to EEG

T. Blu, D. Kandaswamy, D. Van De Ville

Proceedings of the SIAM Conference on Imaging Science (SIS'10), Chicago IL, USA, April 12-14, 2010, pp. 68.

Electroencephalography (EEG) provides us with a non- invasive way to access information about the brain's cortical activity. Mapping back the electrical potential measured on the scalp to the underlying source configuration is known as "source imaging". To render the problem well-posed, additional constraints on the solution are needed. Specifically, we use a parametric source model (sum of dipoles) and we propose a new framework termed "analytic sensing," that lead to a non-iterative technique for multi-dipole fitting. The key contribution is to apply analytic test functions that "sense" the influence of the source distribution around virtual sensors. The choice of these sensors allows us to estimate the dipoles' positions by finding an annihilation filter similar to "finite rate of innovation" techniques. We show how to apply analytic sensing to 3D and to EEG in particular. Preliminary results demonstrate the technique's potential to retrieve multiple dipoles at once, a problem that is difficult to solve by (numerical) least-squares fitting due to the many local minima.

AUTHOR="Blu, T. and Kandaswamy, D. and Van De Ville, D.",
TITLE="Analytic Sensing: {A} New Approach to Source Imaging and Its
        Application to {EEG}",
BOOKTITLE="Proceedings of the {SIAM} Conference on Imaging Science
address="Chicago IL, USA",
month="April 12-14,",

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