Biomedical Imaging GroupSTI
English only   BIG > Publications > Higher-Order TV

 Home Page
 News & Events
 Tutorials and Reviews
 Download Algorithms

 All BibTeX References

Higher-Order Total Variation Reconstruction for Structured Illumination Microscopy (SIM)

L. Donati, D. Fortun, D. Sage, M. Unser

Proceedings of the 2016 ZEISS Symposium on Optics in the Digital World (ZSODW'16), Oberkochen, Federal Republic of Germany, June 23, 2016.

Structured illumination microscopy (SIM) is an effective and widely used method for producing high-resolution fluorescence micrographs. This imaging technique successively overcomes the diffraction limit and reaches up to twice the lateral resolution of conventional wide-field microscopy [1]. In SIM, the sample is imaged with varying configurations of an illumination pattern and a high-resolution image is reconstructed from the collected data (i.e. multiple low-resolution images). The quality of the reconstructed image depends strongly on the type of reconstruction method used. The classical Gustaffson-Heintzmann reconstruction method relies on a sequence of demodulation and recombination of the measurements, followed by some Wiener filtering [1]. This direct method typically does not include prior information about the image. Other recent approaches based on an variational formulation of the reconstruction have shown promising results for SIM [2, 3].


  1. M.G.L. Gustafsson, "Surpassing the Lateral Resolution Limit by a Factor of Two Using Structured Illumination Microscopy," Journal of Microscopy, vol. 198, no. 2, pp. 82-87, May 2000.

  2. F. Orieux, E. Sepulveda, V. Loriette, B. Dubertret, J.-C. Olivo-Marin, "Bayesian Estimation for Optimized Structured Illumination Microscopy," IEEE Transactions on Image Processing, vol. 21, no. 2, pp. 601-614, February 2012.

  3. J. Boulanger, N. Pustelnik, L. Condat, "Non-Smooth Convex Optimization for an Efficient Reconstruction in Structured Illumination Microscopy," Proceedings of the Eleventh IEEE International Symposium on Biomedical Imaging: From Nano to Macro (ISBI'14), Beijing, People's Republic of China, April 29-May 2, 2014, pp. 995-998.

AUTHOR="Donati, L. and Fortun, D. and Sage, D. and Unser, M.",
TITLE="Higher-Order Total Variation Reconstruction for Structured
        Illumination Microscopy ({SIM})",
BOOKTITLE="Proceedings of the 2016 ZEISS Symposium on Optics in the
        Digital World ({ZSODW'16})",
address="Oberkochen, Federal Republic of Germany",
month="June 23,",

© 2016 Zeiss. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from Zeiss.
This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder.