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Higher-Order Total Variation Reconstruction for Structured Illumination Microscopy (SIM)

L. Donati, D. Fortun, D. Sage, M. Unser

Proceedings of the 2016 ZEISS Symposium on Optics in the Digital World (ZSODW'16), Oberkochen, Federal Republic of Germany, June 23, 2016.



Structured illumination microscopy (SIM) is an effective and widely used method for producing high-resolution fluorescence micrographs. This imaging technique successively overcomes the diffraction limit and reaches up to twice the lateral resolution of conventional wide-field microscopy [1]. In SIM, the sample is imaged with varying configurations of an illumination pattern and a high-resolution image is reconstructed from the collected data (i.e. multiple low-resolution images). The quality of the reconstructed image depends strongly on the type of reconstruction method used. The classical Gustaffson-Heintzmann reconstruction method relies on a sequence of demodulation and recombination of the measurements, followed by some Wiener filtering [1]. This direct method typically does not include prior information about the image. Other recent approaches based on an variational formulation of the reconstruction have shown promising results for SIM [2, 3].

References

  1. M.G.L. Gustafsson, "Surpassing the Lateral Resolution Limit by a Factor of Two Using Structured Illumination Microscopy," Journal of Microscopy, vol. 198, no. 2, pp. 82-87, May 2000.

  2. F. Orieux, E. Sepulveda, V. Loriette, B. Dubertret, J.-C. Olivo-Marin, "Bayesian Estimation for Optimized Structured Illumination Microscopy," IEEE Transactions on Image Processing, vol. 21, no. 2, pp. 601-614, February 2012.

  3. J. Boulanger, N. Pustelnik, L. Condat, "Non-Smooth Convex Optimization for an Efficient Reconstruction in Structured Illumination Microscopy," Proceedings of the Eleventh IEEE International Symposium on Biomedical Imaging: From Nano to Macro (ISBI'14), Beijing, People's Republic of China, April 29-May 2, 2014, pp. 995-998.


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