Biomedical Imaging GroupSTI
English only   BIG > Publications > Compressed Sensing

 Home Page
 News & Events
 Tutorials and Reviews
 Download Algorithms

 All BibTeX References

Compressed Sensing for Dose Reduction in STEM Tomography

L. Donati, M. Nilchian, M. Unser, S. Trépout, C. Messaoudi, S. Marco

Proceedings of the Fourteenth IEEE International Symposium on Biomedical Imaging: From Nano to Macro (ISBI'17), Melbourne, Commonwealth of Australia, April 18-21, 2017, pp. 23-27.

We designed a complete acquisition-reconstruction framework to reduce the radiation dosage in 3D scanning transmission electron microscopy (STEM). Projection measurements are acquired by randomly scanning a subset of pixels at every tilt-view (i.e., random-beam STEM or RB-STEM ). High-quality images are then recovered from the randomly downsampled measurements through a regularized tomographic reconstruction framework. By fulfilling the compressed sensing requirements, the proposed approach improves the reconstruction of heavily-downsampled RB-STEM measurements over the current state-of-the-art technique. This development opens new perspectives in the search for methods permitting lower-dose 3D STEM imaging of electron-sensitive samples without degrading the quality of the reconstructed volume. A Matlab code implementing the proposed reconstruction algorithm has been made available online.

AUTHOR="Donati, L. and Nilchian, M. and Unser, M. and Tr{\'{e}}pout, S.
        and Messaoudi, C. and Marco, S.",
TITLE="Compressed Sensing for Dose Reduction in {STEM} Tomography",
BOOKTITLE="Proceedings of the Fourteenth {IEEE} International Symposium
        on Biomedical Imaging: {F}rom Nano to Macro ({ISBI'17})",
address="Melbourne, Commonwealth of Australia",
month="April 18-21,",

© 2017 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from IEEE.
This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder.