EPFL
 Biomedical Imaging GroupSTI
EPFL
  Publications
English only   BIG > Publications > Biplane Calibration


 CONTENTS
 Home Page
 News & Events
 People
 Publications
 Tutorials and Reviews
 Research
 Demos
 Download Algorithms

 DOWNLOAD
 PDF
 Postscript
 All BibTeX References

A PSF-Based Approach to Biplane Calibration in 3D Super-Resolution Microscopy

H. Kirshner, T. Pengo, N. Olivier, D. Sage, S. Manley, M. Unser

Proceedings of the Ninth IEEE International Symposium on Biomedical Imaging: From Nano to Macro (ISBI'12), Barcelona, Kingdom of Spain, May 2-5, 2012, pp. 1232-1235.



Super-resolution localization microscopy methods such as PALM and STORM have been shown to provide imaging with resolutions up to a few tens of nanometers while using relatively simple setups. Biplane PALM has extended the PALM technique to three-dimensions, by simultaneously using two imaging planes, with different focal depths. A key aspect in achieving good axial localization results is the alignment of the two planes. Currently available approaches assume that misaligned planes only result in scaling and rotation of the PSF pattern. We show in this work that this does not necessarily hold true, especially in the presence of refractive index mismatch between the different optical layers. Instead, we suggest a calibration algorithm that relies on a realistic PSF model and finds the affine transform that relates the two planes with respect to a point source in the object domain. Our calibration algorithm also determines the defocus distance between the planes.


@INPROCEEDINGS(http://bigwww.epfl.ch/publications/kirshner1201.html,
AUTHOR="Kirshner, H. and Pengo, T. and Olivier, N. and Sage, D. and
        Manley, S. and Unser, M.",
TITLE="A {PSF}-Based Approach to Biplane Calibration in {3D}
        Super-Resolution Microscopy",
BOOKTITLE="Proceedings of the Ninth {IEEE} International Symposium on
        Biomedical Imaging: {F}rom Nano to Macro ({ISBI'12})",
YEAR="2012",
editor="",
volume="",
series="",
pages="1232--1235",
address="Barcelona, Kingdom of Spain",
month="May 2-5,",
organization="",
publisher="",
note="")

© 2012 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from IEEE.
This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder.