EPFL
 Biomedical Imaging GroupSTI
EPFL
  Publications
English only   BIG > Publications > Tomographic Reconstruction


 CONTENTS
 Home Page
 News & Events
 People
 Publications
 Tutorials and Reviews
 Research
 Demos
 Download Algorithms

 DOWNLOAD
 PDF
 Postscript
 All BibTeX References

Random-Beam STEM Acquisition Method for Tomographic Reconstruction Based on Compressive Sensing

S. Trépout, L. Donati, M. Nilchian, M. Unser, S. Marco

Thirteenth International Conference on x-Ray Microscopy (XRM'16), Oxford, United Kingdom, August 15-19, 2016.



Scanning transmission electron microscopy (STEM) is nowadays becoming a powerful tool for electron tomography in biology. It allows the observation of thick (more than 700 nm) resin embedded samples [1] and is also valuable for cryo-electron tomography [2]. STEM is based on dot acquisition during a scanning process, which is well adapted to perform projection measurements by randomly scanning pixel subsets at every tilt view for tomography. This acquisition procedure, call random-beam STEM (RB-STEM) allows to reduce the electron radiation dosage required for accurate imaging of frozen-hydrated biological nano-structures and it is compatible with compressive sensing approaches [3]. Here we present a tomographic acquisition and reconstruction pipeline based on RB-STEM, fully exploiting compressive sensing principles. This pipeline opens the path for the development of optimized low-dose cryo-STEM tomography adapted for thick biological samples.

References

  1. S. Trepout, C. Messaoudi, S. Perrot, P. Bastin, S. Marco, "Scanning Transmission Electron Microscopy Through-Focal Tilt-Series on Biological Specimens," Micron, vol. 77, pp. 9-15, October 2015.

  2. S.G. Wolf, L. Houben, M. Elbaum, "Cryo-Scanning Transmission Electron Tomography Of Vitrified Cells," Nature Methods, vol. 11, no. 4, pp. 423-429, April 2014.

  3. L. Donati, M. Nilchian, S. Trépout, C. Messaoudi, S. Marco, M. Unser, "Compressed Sensing for STEM Tomography," Ultramicroscopy, vol. 179, pp. 47-56, August 2017.


@INPROCEEDINGS(http://bigwww.epfl.ch/publications/trepout1601.html,
AUTHOR="Tr{\'{e}}pout, S. and Donati, L. and Nilchian, M. and Unser, M.
        and Marco, S.",
TITLE="Random-Beam {STEM} Acquisition Method for Tomographic
        Reconstruction Based on Compressive Sensing",
BOOKTITLE="Thirteenth International Conference on x-Ray Microscopy
        ({XRM'16})",
YEAR="2016",
editor="",
volume="",
series="",
pages="",
address="Oxford, United Kingdom",
month="August 15-19,",
organization="",
publisher="",
note="")

© 2016 Diamond Light Source. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from Diamond Light Source.
This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder.