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Comparison of Various Filter Sets for Defect Detection in Textiles

F. Ade, N. Lins, M. Unser

Proceedings of the Seventh IEEE International Conference on Pattern Recognition (ICPR'84), Montréal QC, Canada, July 30-August 2, 1984, vol. I, pp. 428-431.



Several orthonormal and nonorthonormal local transforms are compared with respect to their performance in a defect-detection system. In this general system, statistics of the outputs of the transforms in macro-windows of a certain size are used to arrive at a set of feature planes. The values of these feature planes at each pixel location are combined into a Mahalanobis distance, which is a measure of the intensity of the defect at this location. The values of quantitative global performance indicators are given.


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