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Resolution Assessment of 3D Reconstructions by Spectral Signal-to-Noise Ratio

M. Unser, M.J. Vrhel, J.F. Conway, M. Gross, P. Thévenaz, A.C. Stevens, B.L. Trus

Proceedings of the Eleventh European Congress on Microscopy (EUREM'96), Dublin, Eire, August 26-30, 1996, pp. III.260-III.261.



One approach for assessing the resolution limit for 3D reconstructions calculated from electron micrograph data has been to compute two independent intensity maps and to test for the concordance of their 3D Fourier components, for example, by differential phase residuals (DPR), or Fourier ring correlation (FRC). While this approach provides a good test for the reproducibility of the experiment, it constrains us to calculate resolution limits based on subsets of he available data. In addition, it does not explicitly test for the validity of the reconstruction process—reproducibility alone does not guarantee that the calculated density maps accurately represent the raw data. These problems are avoided in the method developed by Conway et al. in which an FRC-based resolution assessment is made between each constituent raw image of the 3D density maps and its corresponding reprojection from that map, and these are then averaged over all such image/reprojection pairs for the map. However, use of the FRC in this way raises the difficulty of determining a statistically sound resolution threshold. This motivated us to develop an alternative criterion to FRC within the framework of comparing all image/reprojection pairs. This new criterion, the Spectral Signal-to-Noise Ratio (SSNR), is based on previous work in 2D.


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