Efficient Pattern Calibration and Image Super-Resolution for Structured Illumination Microscopy
Ning Chu, LIB | STI | EPFL

Seminar • 16 March 2015 • BM 4.235

Abstract
Structured Illumination Microscopy (SIM) has been one of the most widely used and the most effective methods in cell-structure imaging since last decade. However, the SIM is very sensitive to the imperfection of the illumination pattern--the exact angle-rotations and phase-shifts etc. Without pattern calibrations, most of the state of the art methods can hardly achieve high resolution in practical use. In order to overcome this inevitable drawback, we first propose an efficient calibration approach based on the cross-correlation between the modulated frequency harmonics. Our calibration approach is able to estimate all the phase shifts and angle rotations just from the observed wide-filed fluorescent images, even in the worst case where the pattern cannot be seen at all in the observed images. After calibrations, we propose a robust and efficient regularisation approach based on TV-L1 and ADMM techniques. The proposed approach can obtain at least as good results as the state of the art SIM methods do, but get less artefact blurs and more detail contrasts. Finally, we show that the phase-shifts are not necessary to be estimated, whereas they are indispensable for some of the classical SIM methods. Without knowing all of the phases, our proposed regularisation approach can still work well and get much better image reconstructions. We will present the method validation through simulations and various real data from our partners.