SURE-Based Wavelet Thresholding Integrating Inter-Scale Dependencies
F. Luisier, T. Blu, M. Unser
Proceedings of the 2006 Thirteenth IEEE International Conference on Image Processing (ICIP'06), Atlanta GA, USA, October 8-11, 2006, pp. 1457–1460.
We propose here a new pointwise wavelet thresholding function that incorporates inter-scale dependencies. This non-linear function depends on a set of four linear parameters per subband which are set by minimizing Stein's unbiased MSE estimate (SURE). Our approach assumes additive Gaussian white noise.
In order for the inter-scale dependencies to be faithfully taken into account, we also develop a rigorous feature alignment processing, that is adapted to arbitrary wavelet filters (e.g. non-symmetric filters).
Finally, we demonstrate the efficiency of our denoising approach in simulations over a wide range of noise levels for a representative set of standard images.
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