Wavelet-Based Identification and Classification of Local Symmetries in Microscopy Images
Z. Püspöki, M. Unser
Proceedings of the Eleventh IEEE International Symposium on Biomedical Imaging: From Nano to Macro (ISBI'14), Beijing, People's Republic of China, April 29-May 2, 2014, pp. 1035–1038.
We present a method for the identification and classification of local symmetries in biological images. We aim at obtaining a precise estimate of symmetric junctions in a scale and rotation invariant way. The proposed method is template-free, which allows the test of any combination of arbitrary symmetry orders in an effective way.
Our measure of local symmetry is derived from a circular harmonic wavelet analysis. The basis functions exhibit different symmetry orders. We use this measure to formulate a classifier to label the different junctions into one of several symmetry classes.
We present experimental results, and validate our method using both on synthetic images and biological micrographs.
@INPROCEEDINGS(http://bigwww.epfl.ch/publications/puespoeki1401.html,
AUTHOR="P{\"{u}}sp{\"{o}}ki, Z. and Unser, M.",
TITLE="Wavelet-Based Identification and Classification of Local
Symmetries in Microscopy Images",
BOOKTITLE="Proceedings of the Eleventh {IEEE} International Symposium on
Biomedical Imaging: {F}rom Nano to Macro ({ISBI'14})",
YEAR="2014",
editor="",
volume="",
series="",
pages="1035--1038",
address="Beijing, People's Republic of China",
month="April 29-May 2,",
organization="",
publisher="",
note="")