Selective plane illumination microscopy (SPIM) is a fluorescence imaging technique that has gained great interest in the microscopy community in recent years. It improves resolution thanks to a perpendicular illumination of the sample with a light sheet, which enables to excite only a very narrow area of the sample and produce good optical sectioning. However, the shape of light sheet tends to deform itself when going through large samples, which causes visual artefacts and a loss of resolution. In this project, the student will develop reconstruction methods taking into account the spatial variability of the light sheet. The first step will be to model and estimate the variation of the point spread function in the sample. The second step will be the deconvolution of the sample using the spatially varying PSF. In a final step, the student will extend his work to reconstruction with mutliple views.