Biomedical Imaging GroupSTI
English only   BIG > Publications > Deforming Tessellations

 Home Page
 News & Events
 Tutorials and Reviews
 Download Algorithms

 All BibTeX References

Deforming Tessellations for the Segmentation of Cell Aggregates

A. Badoual, A. Galan, D. Sage, M. Unser

Proceedings of the Sixteenth IEEE International Symposium on Biomedical Imaging: From Nano to Macro (ISBI'19), Venice, Italian Republic, April 8-11, 2019, pp. 1013-1017.

We present a new active contour to segment cell aggregates. We describe it by a smooth tessellation that is attracted toward the cell membranes. Our approach relies on subdivision schemes that are tightly linked to the theory of wavelets. The shape is encoded by control points grouped in tiles. The smooth and continuously defined boundary of each tile is generated by recursively applying a refinement process to its control points. We deform the smooth tessellation in a global manner using a ridge-based energy that we have designed for that purpose. By construction, cells are segmented without overlap and the tessellation structure is maintained even on dim membranes. Leakage, which afflicts usual image-processing methods (e.g., watershed), is thus prevented. We validate our framework on both synthetic and real microscopy images, showing that the proposed method is robust to membrane gaps and to high levels of noise.

AUTHOR="Badoual, A. and Galan, A. and Sage, D. and Unser, M.",
TITLE="Deforming Tessellations for the Segmentation of Cell Aggregates",
BOOKTITLE="Proceedings of the Sixteenth IEEE International Symposium on
        Biomedical Imaging: From Nano to Macro ({ISBI'19})",
address="Venice, Italian Republic",
month="April 8-11,",

© 2019 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from IEEE.
This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder.